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 SFF10N60
Silicon N-Channel MOSFET
Features
10A,600V ,RDS(on)(Max0.75)@VGS=10V Ultra-low Gate Charge(34nC) Fast Switching Capability 100%Avalanche Tested Improved dv/dt capability
General Description
This Power MOSFET is produced using Winsemi's advanced planar stripe,DMOS technology. This latest technology has been especially designed to minimize on -state resistance,have a high rugged avalanche characteristics. This devices is specially well suited for high efficiency switch model power supplies , power factor correction ,UPS and a electronic lamp ballast base on half bridge.
Absolute Maximum Ratings
Symbol
VDSS ID Continuous Drain Current (@Tc=100) IDM VGS EAS EAR dv/dt PD Derating Factor above25 TJ,Tstg TL Junction and Storage Temperature Channel Temperature 0.4 -55~150 300 W/ Drain Current Pulsed Gate to Source Voltage Single Pulsed Avalanche Energy Repetitive Avalanche Energy Peak Diode Recovery dv/dt Total Power Dissipation (@Tc=25) (Note2) (Note1) (Note3) (Note1) 6.0* 40* 30 713 18 4.5 50 A A V mJ mJ V/ns W Drain Source Voltage Continuous Drain Current (@Tc=25)
Parameter
Value
600 10*
Units
V A
*Drain current limited by maximum junction temperature
Thermal Characteristics
Symbol
RQJC RQJA
Parameter
Thermal Resistance, Junction-to-Case Thermal Resistance, Junction-to-Ambient
Value Min
-
Typ
-
Max
2.5 62.5
Units
/W /W
Rev.A Aug.2010
Copyright@WinSemi Semiconductor Co., Ltd., All right reserved.
SFF10N60
Electrical Characteristics(Tc=25)
Characteristics
Gate leakage current Gate-source breakdown voltage Drain cut -off current Drain-source breakdown voltage Gate threshold voltage Drain-source ON resistance Forward Trans conductance Input capacitance Reverse transfer capacitance Output capacitance Rise time Turn-on time Switching time Fall time Turn-off time Total gate charge(gate-source Qg plus gate-drain Gate-source charge Gate-drain("miller")Charge Qgs Qgd VGS=10V, nC ID=10A (Note4,5) 6.9 12 tf toff VDD=480V, 34 45 RG=25 (Note4,5) 214 85 300 165
Symbol
IGSS V(BR)GSS IDSS V(BR)DSS VGS(th) RDS(ON) gfs Ciss Crss Coss tr ton
Test Condition
VGS=30V,VDS=0V IG=10A,VDS=0V VDS=600V,VGS=0V ID=250A,VGS=0V VDS=10V,ID=250A VGS=10V,ID=4.75A VDS=50V,ID=4.75A VDS=25V, VGS=0V, f=1MHz VDD=300V, ID=10A,
Min
30 500 3 -
Type
0.66 8.2 1610 156 20 68 109
Max
100 1 3.5 0.75 2065 210 26 91 150
Unit
nA V A V V S
pF
ns
Source-Drain Ratings and Characteristics(Ta=25)
Characteristics
Continuous drain reverse current Pulse drain reverse current Forward voltage(diode) Reverse recovery time Reverse recovery charge
Symbol
IDR IDRP VDSF trr Qrr
Test condition
IDR=10A,VGS=0V IDR=10A,VGS=0V, dIDR /dt=100 A / s
Min
-
Type
1.05 442 2.16
Max
10 38 1.4 633 3.24
Unit
A A V ns C
Note 1. Repeativity rating: pulse width limited by junction temperature 2. L=14.5mH, IAS=10A, VDD=50V, RG=25, Starting TJ=25 3. ISD10A, di/dt300A/us, VDD2/7
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SFF10N60
Fig.1 On -State Characteristics
Fig.2 Transfer characteristics
Fig.3 Capacitance Variation vs Drain Voltage
Fig.4 On-Resistance Variation Energy vs Drain Current and Gate Voltage
Fig.5 On-Resistance Variation vs Junction temperature
Fig.6 Gate Charge characteristics
3/7
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SFF10N60
Fig.7 Maximum Safe Operation Area
Fig.8 diode Forward voltage Variation vs Source Current and Temperature
Fig.9 Transient Thermal response Curve
4/7
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SFF10N60
Fig.10 Gate Test Circuit & Waveform
Fig.11 Resistive Switching Test Circuit & Waveform
Fig.12 Unclamped Inductive switching Test Circuit& Waveform
5/7
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SFF10N60
Fig.13 Peak Diode Recovery dv/dt Test Circuit & Waveform
6/7
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SFF10N60
TO-220F Package Dimension
Unit :mm
7/7
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